HF Test 30/150/450/800-5
Automated 5 kV High-Frequency Test System for Accelerated Ageing and Dielectric Degradation of Insulation Materials in SiC and GaN Applications
- Designed to stress 20 gate drivers at voltages up to 5 kV (rms) at 30, 150, 450 or 800 kHz, also intended for IGBTs and superjunction MOS
- Continuous HV HF stress until breakdown to cover all physical degradation mechanisms
- Automatic evaluation of time-to-breakdown for deriving time-dependent dielectric breakdown (TDDB) behavior and safe operating area (SOA)
- Automated test procedure with state machine for stand-alone operation and reproducible test conditions
- Short-circuit protection and breakdown detection in case of DUT failure
- Automatic identification of failed DUT with HV low-energy DC insulation test followed by high-frequency AC insulation test
- Automatic disconnection of failed DUT and restart of test sequence
- Minimal operator intervention and personnel costs; once the test chamber is loaded, long-term tests can run independently for months
- Remanent system variables and data storage ensure seamless test continuation without data loss after external power failure
- Emergency shutdown of the high-voltage source in case of accidental test chamber opening; inherent electric shock protection by construction design
- System control, graphical user interface, data logging, and network interface based on Siemens Simatic S7 platform
- Remote access to log files and test status via LAN
- Modular system design, intended for 19" rack installation; three modules in one rack form a complete test system with minimal footprint
- One dedicated test frequency per module
For further information, please feel free to contact us.
