Introduction HVsys

Decarbonizing key sectors such as energy, mobility, and heating, along with the ongoing electrification of energy systems, requires compact, energy- and resource-efficient, and long-term reliable conversion of electrical energy.

SiC and GaN wide-bandgap semiconductors are regarded as key technologies for this profound transformation, operating at increasingly higher voltages and switching frequencies. To ensure reliable energy conversion under these conditions over long lifecycles, a deep understanding of the dielectric aging and failure behavior of insulation systems is crucial - especially in reliability-critical fields such as infrastructure, industry, medical, military, and space.

HVsys therefore develops automated testing methods, test equipment, and testing services to analyze the dielectric aging and degradation behavior of insulation systems under long-term high-voltage and high-frequency stress up to 5 kV (rms) and 800 kHz for next-gen power semiconductor applications.

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